X-ray excited optical luminescence and spatially-resolved double-crystal diffractometry were used to study the effect of N impurities on the defect structure. A correlation between N impurities and the raw defect structure was clearly visible. It was confirmed that concentration variations were related to lattice imperfections; where tilts were much more important than lattice-constant variations. High reflectivity was observed, and relatively large zones of a sample which was larger than 1cm2 were shown to be perfect to within better than 0.5arcsec.

Recent Developments of High Quality Synthetic Diamond Single Crystals for Synchrotron X-Ray Monochromators. A.K.Freund, J.Hoszowska, J.P.F.Sellschop, R.C.Burns, M.Rebak: Nuclear Instruments and Methods in Physics Research A, 2001, 467-468, 384-7