Transmission electron microscopy was used to study inclusions and defects in a single crystal of synthetic diamond which had been grown from the Fe-Ni-C system under high-temperature and high-pressure conditions. Stacking-faults, twins and prismatic dislocations were directly observed.

Some Inclusions and Defects in a Synthetic Diamond Single Crystal. L.W.Yin, Z.D.Zou, M.S.Li, Y.X.Liu, Z.Y.Hao, J.J.Cui: Journal of Crystal Growth, 2000, 218[2-4], 455-8