Synchrotron white-beam X-ray topography was used to characterize 2H-type crystals which had been grown via the chemical reduction of methyltrichlorosilane at 1400C. The crystals were in the form of 1mm-long tapered needles, with an hexagonal cross-section, and were 0.4mm in diameter. The topographic images exhibited Pendellösung fringes. Topographs which were recorded for various diffraction vectors revealed no sign of axial screw dislocations. There were also no dislocations having Burgers vectors which lay in the basal planes. The absence of axial screw dislocations indicated that growth was not screw-dislocation assisted, but instead occurred via diffusion-controlled growth.

Synchrotron White-Beam Topographic Studies of 2H-SiC Crystals. W.M.Vetter, W.Huang, P.Neudeck, J.A.Powell, M.Dudley: Journal of Crystal Growth, 2001, 224[3-4], 269-73