Grain boundary structures in thick coated conductors were characterized by using transmission electron microscopy. The films contained low-angle [001] tilt grain boundaries having periodic arrays of edge dislocations parallel to the c-axis. Most of the grain boundary planes were of (100) or (110) type. Grain boundary dislocations, with a [100] Burgers vector, were observed in tilt boundaries with (100) boundary planes. Partial dislocations, separated by stacking faults, were found at boundaries having near-(110) grain boundary planes. Extensive g•b and g•R analyses confirmed that the partials were of ½[110]-type. The results suggested that the characteristics of the dislocation structures depended not only upon the misorientation angle, but also on the type of grain boundary plane.

A Comparison of [001] Low-Angie Tilt Grain Boundaries of (100) and (110) Grain Boundary Planes in YBa2Cu3O7 Coated Conductors. H.Kung, J.P.Hirth, S.R.Foltyn, P.N.Arendt, Q.X.Jia, M.P.Maley: Physica C, 2001, 357-360[2], 959-66