Dislocation dynamics near a free surface and in hetero-epitaxial thin films were simulated by using an extended version of the nanoscale phase field micro-elasticity model of dislocations. The model automatically took into account the effect of image forces on dislocation motion. In particular, the operations of Frank–Read sources in epitaxial films grown on infinitely thick and relatively thin substrates were investigated. The simulation reveals different misfit dislocation behaviors at the interface.

Phase Field Micro-Elasticity Modeling of Dislocation Dynamics Near Free Surface and in Hetero-epitaxial Thin Films. Y.U.Wang, Y.M.Jin, A.G.Khachaturyan: Acta Materialia, 2003, 51[14], 4209-23