Time-dependent scanning tunnelling microscopy was used to observe step fluctuations on Ag(111) thin films just above room temperature. Previously reported step edge diffusion limited fluctuation kinetics were verified by measuring temporal correlation functions. The persistence probability for the step fluctuations was computed from the same data and was found to agree with a numerical prediction of 7/8 for a solid-on-solid model of the edge diffusion process.

Persistence Exponents for Step Edge Diffusion. D.B.Dougherty, O.Bondarchuk, M.Degawa, E.D.Williams: Surface Science, 2003, 527[1-3], L213-8