Positron measurements, both lifetime and annihilation line-shape, were performed in Cd, plastically deformed at room temperature by 40 and 60% thickness reductions. Less change in the line-shape parameter was observed for 60% deformation. The annealing of 40% deformed sample between 25 and 200C indicated a breaking-up of the dislocation network during the recrystallization process.

Positron Trapping in Plastically Deformed Cd. A.Sen Gupta: Solid State Communications, 2002, 122[1-2], 79-82