Mutual diffusion in a polycrystalline Pd–Ag thin film system with an average grain size of 0.1µm was studied at 373 to 523K. The effective diffusion coefficient D was determined by the X-ray diffraction technique in a region with a Pd content of 90 to 95%. The experimental D values were one to two orders of magnitude greater than the average coefficients of diffusion via grain boundaries within the same temperature interval.

Low-Temperature Diffusion in Polycrystalline Pd–Ag Thin Film System. A.D.Vasilev: Technical Physics Letters, 2003, 29[1], 60-1