New complex field-ion microscopic data for the formation of radiation-induced defects in VChV ultra-pure W, VA-3 commercial-grade W, and 4 slightly diluted W-based alloys (W–Hf–C, P39A; W–1.5%ThO2 , VT-15; W–5%Re, VR-5; and W–2%Fe, VZh-2) were reported. Samples were irradiated in an external unit by Ar+ and Ni+ ions of energy 35keV. In the experiments, the ion current was kept at j = 2.0µA and the irradiation fluence equaled 5 x 1014ions/cm2. The clustering of single vacancies in samples irradiated was studied in relation to the impurity concentration and type. The distribution of vacancy clusters over the number of aggregated single vacancies was studied. These distributions were found to differ noticeably inside and outside the depletion zones. The mean lengths of focused substitutional atomic collision chains in samples with different impurity concentrations and types were measured indirectly. From these data, the efficiency of trapping intrinsic interstitials by various impurities in W was estimated.

Effect of Various Components of Slightly Diluted Tungsten-Based Alloys on the Formation of Defects in Atomic Displacement Cascade Regions - Field-Ion Microscopic Analysis. A.L.Suvorov, A.G.Zaluzhnyi, A.F.Bobkov, S.V.Zaitsev, V.P.Babaev, M.I.Guseva, S.N.Korshunov, I.N.Nikolaeva, A.A.Zaluzhnyi: Technical Physics, 2003, 48[1], 110-4