The effect of grain boundaries on diffusion in polycrystalline C60 thin films was studied. The electrically induced diffusion of Au was investigated by making in situ measurements of the film conductivity. Electron paramagnetic resonance spectroscopy was used to study the diffusion of O. An increase in grain size of polycrystalline C60 thin films was found to result in the acceleration of Au and O diffusion. The results were explained by assuming that these impurities diffused films mainly along grain boundaries in C60.

Grain Boundary Diffusion in C60 Thin Films. E.A.Katz, S.M.Tuladhar, D.Faiman, A.I.Shames, S.Shtutina: Interface Science, 2001, 9[3-4], 331-5