Experimental observations were made of the low-loss electron energy-loss spectroscopy of grain boundary dislocations in chemical vapour deposited films. The results were interpreted by using ab initio calculations, in which low-loss and core-excitation electron energy-loss spectra from various dislocation cores were modelled and compared with bulk spectra. In particular, the 60° glide, 60° shuffle and ½[110] screw dislocations were considered, as well as the 30° and 90° partial glide dislocations and a 90° shuffle vacancy structure. These simulations suggested the absence of deep gap states for the more stable partial dislocations, but there were characteristic changes in the low-loss electron energy-loss spectrum in the 6 to 12eV region. The changes were consistent with the experimental spectra from grain boundary dislocations found in B-doped chemical vapour deposited diamond.

Dislocations in Diamond - Electron Energy-Loss Spectroscopy. C.J.Fall, A.T.Blumenau, R.Jones, P.R.Briddon, T.Frauenheim, A.Gutiérrez-Sosa, U.Bangert, A.E.Mora, J.W.Steeds, J.E.Butler: Physical Review B, 2002, 65[20], 205206 (7pp)