The technique of environmental scanning electron microscopy was used to investigate the surface defects of the (111) face in 0.92Pb(Zn1/3Nb2/3)O3–0.08PbTiO3 crystals. By using the environmental scanning electron microscopic images, it was possible to observe and study the growth hillocks and etch pits, low-angle grain boundaries, and sub-grain boundaries on the (111) face, which were related to the generation of dislocation and stacking faults, respectively. On the other hand, an image of a unique multi-layer lamellar structure and fine step structure obtained in the (111) face reveals that the dominant fast growth mechanism of the present crystals, as grown by using the flux method, was a sub-step mechanism; unlike the screw dislocation growth mechanism.

Environmental SEM Investigation on Surface Defects in 0.92Pb(Zn1/3Nb2/3)O3–0.08PbTiO3 Single Crystal. J.Xiao, M.Shao, S.Yin: Journal of Crystal Growth, 2002, 240[3-4], 521-5