The development of the statistical parameters of the dislocation structure during the plastic deformation of single crystals (average dislocation density, and average

dislocation density fluctuation) was investigated by means of X-ray diffraction peak profile analysis. It was found that during deformation, while the dislocation density increased monotonically, the average fluctuation exhibited a maximum which corresponded to a transition from stage II to stage III of work hardening. The fractal dimension of the dislocation structure was also investigated, and a strong correlation was found between the fractal dimension and the relative dislocation density fluctuation.

Characterization of Self-Similar Dislocation Structures by X-Ray Diffraction. F.Székely, I.Groma, J.Lendvai: Materials Science and Engineering A, 2002, 324[1-2], 179-82