A Ruddlesden–Popper-type planar fault was introduced at the SrRuO3/BaTiO3 interface of a SrRuO3/BaTiO3/SrRuO3 heterofilm system by using different processing conditions for the individual film layer. This fault occurred continuously and homogeneously along the interface; forming an extra Sr-rich sub-nm layer. The structure of the fault, and the lattice behavior in the interface area, were characterized at the atomic scale by properly imaging all types of atomic column, especially pure O columns, by means of spherical-aberration corrected high-resolution transmission electron microscopy. Information on local interdiffusion and lattice strain at the interface was obtained by quantitative evaluation of the atomic resolution images.

Introduction and Characterization of Interfacial Defects in SrRuO3/BaTiO3/SrRuO3 Multilayer Films. C.L.Jia, J.R.Contreras, J.Schubert, M.Lentzen, U.Poppe, H.Kohlstedt, K.Urban, R.Waser: Journal of Crystal Growth, 2003, 247[3-4], 381-6