The growth defects in crystals were investigated by means of white-beam synchrotron radiation topography for the first time. It was found that inclusions, dislocations and growth sector boundaries were the primary growth defects near to the seed. The area away from the seed was nearly free of defects. Based on the experimental observationsthe formation mechanism of brown region in the crystals was analyzed. Twins and growth sector boundaries exist in the brown region, which was the key reason resulting in brown presentation. The approaches to reduce and eliminate the defects were presented.

Growth Defects in BiB3O6 Crystals Observed with White-Beam Synchrotron Topography. B.Teng, J.Wang, X.Cheng, Z.Wang, H.Jiang, S.Dong, Y.Liu, Z.Shao: Journal of Crystal Growth, 2002, 235[1-4], 407-10