It was shown that YHx could be used to monitor and control H diffusion in thin films. The diffusion coefficient was typically equal to 10-5cm2/s, for concentrations around 0.7H/V, between 373 and 473K. The deposition of an Y layer on V also made it possible to tune the effective H mobility via the V/Y thickness ratio. This could be used to investigate H diffusion waves in laterally structured objects.

Switchable Mirrors for Visualization and Control of Hydrogen Diffusion in Transition Metals. A.Remhof, S.J.Van der Molen, A.Antosik, A.Dobrowolska, N.J.Koeman, R.Griessen: Physical Review B, 2002, 66[2], 020101 (4pp)

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