Transmission electron microscopic images of disclination defects were modelled within the framework of the Howie-Whelan 2-beam approach by taking account of the elastic distortions which were associated with the defects. Disclinations were generated during the course of plastic deformation, and could be observed in the junctions of grain or cell boundaries. The disclination lines were assumed to be parallel or perpendicular to the free surfaces of a thin foil. In such a geometry, disclination elastic fields in the foil interior were constructed by using the technique of so-called virtual surface defects. The results demonstrated the possibility of extracting disclination parameters from transmission electron microscopic observations.

Transmission Electron Microscopy Image Contrast of Disclination Defects in Crystals. A.L.Kolesnikova, V.Klemm, P.Klimanek, A.E.Romanov: Physica Status Solidi A, 2002, 191[2], 467-81