Nano-indentation was used to study the onset of plasticity under contact loading. Fracture of the sample was avoided under loads ranging from 0.2 to 10mN, and plastic zones could be observed using transmission electron microscopy. The variation in zone-size with load was measured and analyzed, and the results were compared with those obtained for GaAs when deformed under the same conditions. Characterization of the dislocations present showed that twin formation in InP differed strongly from that in GaAs.

Low-Load Deformation of InP under Contact Loading - Comparison with GaAs. E.Le Bourhis, G.Patriarche: Philosophical Magazine A, 2002, 82[10], 1953-61