Dislocations visible in X-ray topographs of as-grown hexagonal SiC Lely platelets and physical vapor transport process wafers extinguished as if they had Burgers vectors of 1/3<11•0>. Under the electron microscope, beneath the resolution of X-ray topography, short lengths of these dislocations were shown to consist of pairs of 1/3<10•0> Shockley partials spanning narrow ribbons of stacking fault. An unusual example of a b = 1/3<11•0> dislocation in a Lely platelet visibly separated into its partials in an X-ray topograph was presented.

Partial Dislocations in the X-Ray Topography of As-Grown Hexagonal Silicon Carbide Crystals. W.M.Vetter, M.Dudley: Materials Science and Engineering B, 2001, 87[2], 173-7