Etch pits on both {111}B and {211}B faces of ZnCdTe were studied by etching. The Everson method was confirmed to be a better method to show dislocations on the B face of CdZnTe and showed the same etch pit density as that of the Nakagawa method. The further study revealed that there were two kinds of etch pits with different shapes on both {111} and {211} surfaces of CdZnTe samples etched using an Everson solution. They correspond to two different kinds of dislocations. It was also found that the etch-pit density revealed by the E1-Ag etchant was one order of magnitude lower than that of the etch-pit densities found using the Everson etchant, which implies that there were at least three kinds of dislocations in CdZnTe materials. The shapes of etch pits and etch-pit density distributions were also studied.

Dislocation Assessment of CdZnTe by Chemical Etching on both {111}B and {211}B Faces. J.Yang, H.Gu, X.Chen, W.Fang, L.He: Journal of Crystal Growth, 2002, 234[2-3], 337-42