It was shown that X-ray spectroscopic methods (EXAFS, XEOL) permitted the determination of the structure of intrinsic or impurity luminescence centers in alkali-halide crystals and the investigation of the dynamics of their change under ionizing radiation. The methods were notable for their high sensitivity. The possibilities of the methods were demonstrated for KBr, NaCl:Ni, and NaCl:Ni,Cu crystals. New data on the structures of various luminescence centers, and on the dynamics of their changes, were obtained.

Luminescent Method of Measuring the EXAFS Spectra of Structural Defects of Alkali Halide Crystals. V.I.Kochubei, Y.G.Konyukhova, K.E.Gyunsburg: Journal of Applied Spectroscopy, 2002, 69[2], 265-9