A study was made of ion-induced electron emissions from bent crystals during bombardment with 7MeV H+. A cylindrical mirror electron analyzer of wide angular acceptance permitted low beam-dose measurements to be made of the high-energy shadowing effect, with a negligible influence arising from radiation damage. Most shadowing patterns revealed the coexistence of clear and smeared planar images of the crystal planes. This implied a preferential distribution of edge dislocations, which was introduced during bending, by cleavage of the crystals. The present work demonstrated the power of ion-induced electron emissions for material characterization under very low beam-induced damage.

Structural Analysis of Bent KCl and NaCl Crystals with Ion-Induced Electron Spectroscopy. H.Kudo, T.Kumaki, K.Haruyama, Y.Tsukamoto, S.Seki, H.Naramoto: Nuclear Instruments and Methods in Physics Research B, 2001, 174[4], 512-8