Thin film samples were prepared by using the vacuum thermal evaporation method, and the hexagonal phase was detected by using glancing-angle X-ray diffraction. The F− ion conduction through the grains and grain boundaries was analyzed by using impedance methods. The modulus spectra revealed a non-Debye nature and a distribution of relaxation times for the film.

Ion Conduction Studies of LaF3 Thin Film by Impedance Spectroscopy. S.Selvasekarapandian, M.Vijayakumar, T.Gnanasekaran, S.Fujihara, S.Koji: Physica B, 2003, 337[1-4], 52-7