It was recalled that the plane of extended deformation-induced boundaries (geometrically necessary boundaries), as determined by transmission electron microscopy, had been found to be grain-orientation dependent. Thus, some grains had boundaries which were aligned with slip planes, while others did not. In both types of grains, the boundaries were aligned with macroscopic planes. An analysis, using electron back-scattered diffraction, had found no evidence for the alignment of boundaries with slip planes or any other simple crystallographic plane. There was only a macroscopic alignment. This discrepancy was considered on the basis of a critical comparison of transmission electron microscopy and electron back-scattered diffraction-based techniques, and transmission electron microscopic observations of boundary planes in grains, of selected orientation, in cold-rolled Al. The latter clearly showed that the electron back-scattered diffraction findings were incorrect. The present analysis confirmed that grain-orientation dependent boundary planes were a general phenomenon.

Critical Comparison of Dislocation Boundary Alignment Studied by TEM and EBSD - Technical Issues and Theoretical Consequences. G.Winther, X.Huang, A.Godfrey, N.Hansen: Acta Materialia, 2004, 52[15], 4437-46