The interfacial diffusion of multi-layers was studied by using synchrotron X-ray techniques such as X-ray reflectivity, extended X-ray absorption fine structure and high-resolution X-ray scattering. The X-ray reflectivity results indicated that the interfacial roughness of the Fe/Cr multi-layers increased with the Cr-layer thickness. Fourier transforms of extended X-ray absorption fine structure data showed that Fe atoms diffused predominantly into stable Cr layers at the Fe/Cr interface. The high-resolution X-ray scattering results supported the interfacial diffusion of Fe atoms. The study revealed that the predominant interfacial diffusion of Fe atoms into the Cr layers affected the interfacial roughness.

Interfacial Diffusion in Fe/Cr Multilayers Studied by Synchrotron X-Ray Techniques. T.S.Cho, M.S.Yi, S.J.Doh, J.H.Je, D.Y.Noh: Physica Status Solidi B, 2004, 241[7], 1748-51