Self-diffusion on a polycrystalline surface was measured, at temperatures ranging from 300 to 773K, by using an atomic force microscope. The so-called single surface scratch method was used. A technique was developed which produced reproducible surface scratches using the atomic force microscope. Analysis of the scratches was also performed via atomic force microscopy. The activation energy of the surface diffusion process was deduced to be equal to 0.4eV by means of time- and temperature-dependent scratch profile measurements.

H.Göbel, P.Von Blanckenhagen: Surface Science, 1995, 331-333, 885-90