Secondary ion mass spectrometry methods were used to study the diffusion of Al in single crystals at 914 to 1212K. The results could be described by:

D (cm2/s) = 1.0 x 100 exp[-260(kJ/mol)/RT]

W.Gust, M.B.Hintz, A.Lodding, H.Odelius, B.Predel: Physica Status Solidi A, 1981, 64[1], 187-94

Figure 18

Grain-Boundary Diffusivity of Ag in Ni