The void electromigration process in the strip geometry was studied analytically and numerically. The void was assumed to travel along the axis of symmetry of the metal strip, or at the boundary. In each case, the shape and the velocity of the void and the characteristic electrical current were predicted.

A Theoretical Treatment of Void Electromigration in the Strip Geometry. M.Ben Amar, L.J.Cummings, G.Richardson: Computational Materials Science, 2000, 17[2-4], 279-89