Features of the X-ray topography images of edge dislocations perpendicular to the (0001) surface of a 6H-SiC single crystal were described. The contrast of topographs obtained in the regime of anomalous X-ray transmission was compared to the contrast of images obtained by using section X-ray topography in the transmission geometry.

X-Ray Topography Contrast of Edge Dislocations Perpendicular to the 6H-SiC Crystal Surface. A.O.Okunev, I.L.Shulpina: Technical Physics Letters, 2005, 31[6], 491-3