Structure, orientational features, and twinning of epitaxial superconductive YBa2Cu3Ox (YBCO) thin films and YBCO/CeO2 heterostructures on (110) NdGaO3 (NGO) and tilted-axes NdGaO3 substrates with an inclination of normal of the substrate from the [110] axis were investigated by X-ray diffraction methods. Orthorhombic structure of NdGaO3 resulted in an increase of the angle between (110) and (1¯10) twinning planes in YBCO films to 90.20° and in a difference in volume of two twin domain systems. The orientation of epitaxial YBCO thin films was shown to be influenced by the deposition rate and the presence of symmetrical-equivalent directions [110] and [110] in the substrate and [100], [010] and [001] in the CeO2 layer. Domain structure of the YBCO thin film changes with an increase in the inclination angle. The YBCO thin films on the tilted-axes substrates were twinned in the same way as on (110) NGO substrates. However, formation of one or both twinning complexes was suppressed with an increase of the inclination angle.

Twinning and Domain Structure of Epitaxial YBa2Cu3Ox Film Studies by X-Ray Diffraction Methods. I.K.Bdikin, P.B.Mozhaev, Y.E.Mozhaeva, G.A.Ovsyannikov, P.V.Komissinski, I.M.Kotelyanskii, A.L.Kholkin: Journal of Crystal Growth, 2005, 275[1-2], 2475-80