Epitaxial Pb(Mg1/3Nb2/3–δ)O3 relaxor ferroelectric thin films were fabricated by using radio-frequency magnetron sputtering. The structure of the Pb(Mg1/3Nb2/3–δ)O3 (001) thin films evolved, from tetragonal to pseudo-cubic, as the strain was relieved with increasing film thickness. In films of intermediate thickness, antiphase-type planar defects were identified, by synchrotron X-ray scattering, across which the atoms were displaced by ½[±1 ±1 0]. The planar defects appeared during strain relaxation.

Antiphase-Type Planar Defects in Pb(Mg1/3Nb2/3–δ)O3/SrTiO3 Thin Films. S.H.Seo, H.C.Kang, D.Y.Noh, Y.Yamada, K.Wasa: Applied Physics Letters, 2004, 84[16], 3133-5