The H-induced lattice deformation of films was investigated by means of high-resolution transmission electron microscopy and fast Fourier transformation analysis. Deformation of the lattice sites originated from the Bi-oxide layer interface, and shifted up and down by 0.92Å when compared with normal sites in the {115} planes. This distorted perovskite structure resulted in a H-induced degradation of the ferroelectric properties. However, this lattice deformation, and the ferroelectric degradation of SrBi2Nb2O9 films, recovered after annealing in an O ambient.

Lattice Structural Analysis of Hydrogen Induced Defects in SrBi2Nb2O9 Thin Films. I.Kim, Y.T.Kim, S.I.Kim, D.C.Yoo, J.Y.Lee: Physica Status Solidi A, 2004, 201[15], R123-6