Two important aspects of this model, which were critical for obtaining accurate values of the Peierls stress, were examined. The first was related to the sampling scheme (double- or single-counting) of the misfit energy across the glide plane. The second was the effect of atomic relaxation upon the Peierls stress. It was argued that the double-counting scheme was physically more appropriate. An analytical formula was derived for the Peierls stress of dislocations in alternating lattices. The atomic relaxation was shown to play an important role in the Peierls stress for narrow dislocations.

The Peierls-Nabarro Model Revisited. G.Lu, N.Kioussis, V.V.Bulatov, E.Kaxiras: Philosophical Magazine Letters, 2000, 80[10], 675-82