Strain fields around dislocations in diamond were quantitatively characterized at the sub-nm scale. A combination of experimental high-resolution electron microscopy and image analysis, using the geometric phase method, permitted an accurate determination to be made of the local deformations and strain. The results of the strain analysis of the 60° perfect dislocation in diamond were described.

Strain Mapping Around Dislocations in Diamond and cBN. B.Willems, L.C.Nistor, C.Ghica, G.Van Tendeloo: Physica Status Solidi A, 2006, 202[11], 2224-8