Slip systems in indented natural single crystal scheelite were studied using transmission electron microscopy. Indentations with loads from 10 to 200g were applied on (001), (100), (110), and (112) crystallographic planes at room temperature. Focused Ion Beam (FIB) technique was used to machine electron-transparent foils with pre-defined orientations from specific locations in and around the indented areas. Five families of slip systems with a total of 16 physically different slip systems were observed. Most plastic deformation was carried out by two major slip systems, (001)[110] and {112}<11>. The observations were interpreted by using the crystallographic structure of scheelite.

Identification of Slip Systems in CaWO4 Scheelite. P.Mogilevsky: Philosophical Magazine, 2005, 85[30], 3511-39