A study was made of the agglomeration of point defects in ferroelectric ceramics driven by repeated domain switching under cyclic electric field. A finite element method that incorporates mass transfer capacity was formulated to simulate the movement of point defects subjected to the kinetics of pore surface diffusion and domain wall migration. The simulation of pore agglomeration qualitatively agrees with the experimental data, namely the point defects migrate from the edges to the center of the sample under cyclic electric field.

Agglomeration of Point Defects in Ferroelectric Ceramics Under Cyclic Electric Field. L.Geng, W.Yang: Modelling and Simulation in Materials Science and Engineering, 2006, 14, 137-55