Multi-layers were investigated by using an in situ low-angle X-ray diffraction technique. The temperature-dependent interdiffusivities could be described by an Arrhenius relationship (figure 2):

D (m2/s) = 2.02 x 10-20 exp[-0.24(eV)/kT]

giving a diffusivity of 8.22 x 10-24m2/s at 458K. It was concluded that the extremely small values of the pre-exponential factor, and a clear correlation between the pre-exponential factor and the activation energy for interdiffusion suggested that a collective jump mechanism which involved between 8 and 15 atoms governed interdiffusion in the monolayers.

W.H.Wang, H.Y.Bai, W.K.Wang: Journal of Applied Physics, 1999, 86[8], 4262-6

 

Table 15

Diffusivity of 110mAg along Mutually Perpendicular

Directions in (111) Ag/Cu Interphase Boundaries

 

Direction

Temperature (K)

D (m2/s)

sD (m3/s)

[01¯1]

881

2.38 x 10-16

2.76 x 10-20

[01¯1]

773

7.75 x 10-18

4.64 x 10-21

[01¯1]

720

1.00 x 10-18

1.32 x 10-21

[01¯1]

674

1.33 x 10-19

3.63 x 10-22

[01¯1]

593

1.81 x 10-21

4.93 x 10-23

[¯211]

881

2.38 x 10-16

3.01 x 10-20

[¯211]

773

7.75 x 10-18

2.17 x 10-21

[¯211]

673

1.27 x 10-19

1.47 x 10-21