Thin MgB2 films were produced on Al2O3(00▪1) and MgO(100) substrates by using a 2-step method. Thin B films were deposited by pulsed laser deposition, followed by ex situ annealing. Resistance measurements of the deposited MgB2 films revealed a TC of 38.6K for MgB2/Al2O3 and 38.1K for MgB2/MgO. Atomic force microscopy, scanning electron microscopy and X-ray diffraction were used to study the properties. The results indicated that the MgB2/Al2O3 films consisted of well-crystallized grains with a highly c-axis-oriented structure, while the MgB2/MgO films had a dense uniform appearance with an unfixed orientation.

Superconducting MgB2 Thin Films Grown by Pulsed Laser Deposition on Al2O3(0001) and MgO(100) Substrates. S.F.Wang, S.Y.Dai, Y.L.Zhou, Z.H.Chen, D.F.Cui, J.D.Xu, M.He, H.B.Lu, G.Z.Yang, G.S.Fu, L.Han: Superconductor Science and Technology, 2001, 14, 885-7