The diffusion of Zr in -Ti was measured, at temperatures ranging from 823 to 1133K, by using ion beam analysis techniques to determine diffusion profiles. Conventional Rutherford back-scattering with He ions was used at temperatures ranging from 823 to 1012K, and heavy-ion Rutherford back-scattering was used at temperatures which ranged from 873 to 1133K. Arrhenius plots of the data were straight for the temperature range which was considered, and could be described by:
D (m2/s) = 0.0043 exp[-304(kJ/mol)/RT]
Agreement was fairly good within the temperature range where both techniques were used. Upon considering all of the available results for self-diffusion and hetero-diffusion in -Ti and -Zr, clear differences were found between the 2 elements.
R.A.Perez, F.Dyment, H.Matzke, G.Linker, H.Dhers: Journal of Nuclear Materials, 1994, 217[1-2], 48-53
Figure 48
Interdiffusion in Ti/TiAl
Figure 48
Interdiffusion in Ti/TiAl