Diffuse X-ray scattering measurements of dissolved H were carried out at room temperature. It was found that the application of uniaxial stresses which were below the elastic limit led to a transformation of all of the H atoms from 1T to 4T states. Each H atom was delocalized over 4 neighbouring T sites by tunnelling. The diffusion of 4T H, under an external stress applied in a [111]-type direction, was measured at temperatures of between 200 and 340K. The diffusion results could be described by an Arrhenius relationship:

D (cm2/s) = 0.0016 exp[-0.006(eV)/kT]

T.Suzuki, H.Namazue, S.Koike, H.Hayakawa: Physical Review Letters, 1983, 51[9], 798-803

 

Table 314

Diffusivity of Ni in V as a Function of Temperature

 

Temperature (C)

D (cm2/s)

902

2.15 x 10-13

964

1.56 x 10-12

1024

2.42 x 10-12

1068

6.67 x 10-12

1076

1.12 x 10-11

1098

2.00 x 10-11

1122

1.46 x 10-11

1145

4.49 x 10-11

1202

4.23 x 10-11

1240

1.04 x 10-10

1298

3.35 x 10-10

1345

4.47 x 10-10

1392

1.08 x 10-9

1455

1.64 x 10-9

1463

1.50 x 10-9

1486

4.36 x 10-9

1500

1.75 x 10-9

1605

5.88 x 10-9

1660

7.70 x 10-9

1675

2.02 x 10-8