The study of migration of well-characterized grain boundaries in bicrystals of an Fe–Si alloy by in situ synchrotron radiation topography was described. The differences in migration behaviour of the (100)/(110) asymmetrical tilt grain boundary and {hk0} symmetrical tilt grain boundary in the 45° [001] bicrystal at 1293K were clearly connected with intersections of the grain boundary with low-angle sub-grain boundaries or changes of the circular shape of migrating grain boundary to a straight one (faceting on low-index grain boundary planes). From reliable data the product of grain boundary mobility and energy was determined which was comparable with that obtained previously by optical measurements after annealing experiments.

Interaction of Migrating Grain Boundaries with Crystal Defects - Observation by in situ SR Topography. M.Polcarová, P.Lejcek, J.Brádler, V.Paidar, A.Jacques: Journal of Physics D, 2005, 38[10A], A33-8