A method to study the crystal defects at atomic level by high-resolution electron microscopy was introduced. The image taken with a field-emission high-resolution electron microscope and not directly reflecting the examined crystal structure could be transformed into the structure image by means of image deconvolution in combination with dynamical scattering effect correction. The principle of image deconvolution and the procedure of technique were briefly introduced. It was shown that atoms in the dislocation core structures were distinguished individually in the deconvoluted images

and the point resolution of images could be improved up to the information limit of the field-emission high-resolution electron microscope.

A Method of Studying Dislocation Core Structures by High-Resolution Electron Microscopy. F.Li: Science and Technology of Advanced Materials, 2005, 6[7], 755-60