The misorientation relative to the average orientation of a grain and the point-to-point relative misorientation along a line across a moderately cold deformed grain, calculated from an electron back-scattering diffraction data-set, were analysed in detail by visualizing both the misorientation angle and the misorientation axis. The significance of monitoring the misorientation axis was illustrated by an example of a grain subdivided into a misorientation band structure. A new technique to visualize the subdivision structure by assigning colours to misorientations in such a way that the contrast was maximized within a grain was introduced and discussed. Furthermore, some methods for grain boundary reconstruction from electron back-scattering diffraction datasets were compared with the map of the confidence index in order to provide a validation of the accuracy of these methods.

Visualization of Grain Sub-Division by Analysing the Misorientations within a Grain using Electron Backscatter Diffraction. S.Van Boxel, M.Seefeldt, B.Verlinden, P.Van Houtte: Journal of Microscopy, 2005, 218[2], 104-14