The distribution of defects in dislocation tracks in Si plates was studied for various indentation angles. The regularities of variations in the linear density and maximum path of dislocations in slip bands were established. A model was proposed to describe the distribution of dislocations in the dislocation tracks. By fitting the theory to the experimental data, the dependence of this distribution on the energy relaxation time was determined.

Redistribution of Dislocations in Silicon near Stress Concentrators. A.M.Orlov, A.A.Solovev, A.A.Skvortsov, I.O.Yavtushenko: Physics of the Solid State, 2005, 47[11], 2049-54