It was recalled that X-ray line-profile analysis was an efficient non-destructive technique for determining key statistical properties of the dislocation structures which developed during plastic deformation. Here, X-ray line-profile measurements obtained from compressed single crystals were presented. A simple dislocation density evolution model was then based upon the experimental results.

Evolution of the Dislocation Microstructure - a Model Based upon X-Ray Line Profile Measurements. I.Groma, F.Székely: Scripta Materialia, 2006, 54[5], 753-7