Transmission electron microscopy observation of cross-sectional specimens prepared by focused ion beam milling method were applied to study the deep radiation damage and depth profile of point defects generated during ion irradiation in Cu-1wt%Co alloy specimens by means of coherent precipitates. The specimens were irradiated at 250 to 500C by 4 and 0.6MeV self Cu ions to a dose of 0.3dpa. The damage range was observed at depths well beyond that expected from ion damage range calculations.

Analysis of Defects Formation and Mobility during Ion Irradiation by Coherent Precipitates. Z.Li, H.Abe, N.Sekimura: Materials Transactions, 2006, 47[2], 259-62