High-angle annular dark field scanning transmission electron microscopy with Z-contrast was applied to characterize the antiphase boundary of the B2 structure in a rapidly solidified TiPd melt-spun compound. The atomic shift associated with the ½<111>-type displacement vector was directly observed at the boundary. A microstructure modification of the melt-spun compound with the cooling rate during solidification was also described.

High-Angle Annular Dark Field Scanning Transmission Electron Microscopy of the Antiphase Boundary in a Rapidly Solidified B2 Type TiPd Compound. M.Matsuda, T.Hara, E.Okunishi, M.Nishida: Philosophical Magazine Letters, 2007, 87[1], 59-64