Weak-beam diffraction-contrast electron microscope images of stacking-fault tetrahedra were simulated by solving numerically the Howie–Basinski equations, which were well suited for studying the dependence of image contrast on experimental parameters. These simulated images were in good qualitative agreement with experimental transmission electron micrographs. The visibility of small stacking-fault tetrahedra and the relationship between measured image sizes and real stacking-fault tetrahedra sizes were considered.

Electron Microscope Weak-Beam Imaging of Stacking Fault Tetrahedra - Observations and Simulations. M.L.Jenkins, Z.Zhou, S.L.Dudarev, A.P.Sutton, M.A.Kirk: Journal of Materials Science, 2006, 41[14], 4445-53