Radiotracer techniques were used to study diffusion in Hg0.8Cd0.2Te at 230 to 500C. It was found that, at 280C, the diffusivity was proportional to the square root of the partial pressure of Hg. At higher temperatures, the diffusivity was essentially independent of the Hg partial pressure; except at the highest value of the latter, where:

D (cm2/s) = 2.07 x 10-3 exp[-1.15(eV)/kT]

When the diffusivity was independent of the partial pressure:

D (cm2/s) = 6.82 x 10-2 exp[-1.41(eV)/kT]

It was suggested that the self-diffusion mechanism involved native defect complexes.

D.Shaw: Philosophical Magazine A, 1986, 53[5], 727-37