Diffusion profiles were determined by using heavy-ion (40MeV O5+) back-scattering methods. These indicated that the concentration of Hg atoms at the surface reached 4 x 1020/cm3, and that the distribution could be explained in terms of a simple diffusion model. It was shown that the data could be described by:

D (cm2/s) = 5 x 103 exp[-2.0(eV)/kT]

K.Takita, K.Murakami, H.Otake, K.Masuda, S.Seki, H.Kudo: Applied Physics Letters, 1984, 44[10], 996-8